PeterChang張以全
Control in Atomic Force Microscopy (AFM)
High-speed Atomic Force Microscopy (high speed AFM) is research that aims to speed up the scanning process of Atomic Force Microscopes, in order to capture interesting dynamic events at the nano-meter scale. AFM currently is an imaging tool with fine spatial resolution, and the goal here at Andersson Lab seeks to improve its temporal resolution through non-raster scanning, a novel and complementary approach from the more traditional raster scan. We have demonstrated two orders of magnitude improvement in shortening scan times.
AFM are especially suitable in imaging biological samples, and many of these samples often have a string-like feature. For example, a isolated strand of DNA or actin wold only occupy a limit portion of the whole space. Our non-raster scan method takes advantage of this and reduces the scanning time by eliminating the need to image a full squared area, and autonomously track and scan only the string-like sample itself.
block diagram
sample trajectory
